2N6212
300V,2A,35W Through-Hole Transistor-Bipolar Power (>1A) PNP High Voltage
Case Type: TO-66
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 1 A
IB = 125 mA
Test Conditions
IC = 50 mA
VBE(OFF) = 1.5 V
Test Conditions
IC = 50 mA
RBE = 50 Ω
Test Conditions
IC = 50 mA
Test Conditions
VCE = 315 V
VBE(OFF) = 1.5 V
Test Conditions
VCE = 315 V
VBE(OFF) = 1.5 V
TC = 100 °C
Test Conditions
VCE = 150 V
Test Conditions
IC = 1 A
IB = 125 mA
Test Conditions
VCE = 10 V
IC = 200 mA
f = 5 MHz
Test Conditions
VCE = 3.2 V
IC = 1 A
Test Conditions
IE = 500 µA
Test Conditions
VEB = 6 V
Test Conditions
VCC = 200 V
IC = 1 A
IB1 = 125 mA
IB2 = 125 mA
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCC = 200 V
IC = 1 A
IB1 = 125 mA
Test Conditions
VCE = 40 V
tp = 1 s
Test Conditions
VCC = 200 V
IC = 1 A
IB1 = 125 mA
IB2 = 125 mA
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
2N6212 | Sleeve@30 | Discontinued | 300V,2A,35W Through-Hole Transistor-Bipolar Power (>1A) PNP High Voltage | EAR99 | 8541.29.0095 | PBFREE |
Resources
Item | Type |
---|---|
No matching documents found. | |
2N6211-2N6213.PDF | Device Datasheet |
Analytical Test Report:Leads | Analytical Test Report |
Material Composition:TO-66 | Material Composition |
Package Detail Document:TO-66 | Package Detail Document |
Product EOL Notice:2N6211 | Product EOL Notice |
Product Reliability Data:TO-66 Package Reliablity | Product Reliability Data |
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