2N6430

200V,500mA,500mW Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage

Case Type: TO-18

Base-Emitter Saturation Voltage (VBE(SAT))
0.9 V
Collector-Base Breakdown Voltage (BVCBO)
200 V
Collector-Base Cutoff Current (ICBO)
100 nA
Collector-Base Voltage (VCBO)
200 V
Collector-Emitter Breakdown Voltage (BVCEO)
200 V
Collector-Emitter Saturation Voltage (VCE(SAT))
0.5 V
Collector-Emitter Voltage (VCEO)
200 V
Continuous Collector Current (IC)
500 mA
Current Gain-Bandwidth Product (fT)
50 — 200 MHz
DC Current Gain (hFE)
25
DC Current Gain (hFE)
40
DC Current Gain (hFE)
50 — 200
Emitter-Base Breakdown Voltage (BVEBO)
6 V
Emitter-Base Cutoff Current (IEBO)
100 nA
Emitter-Base Voltage (VEBO)
6 V
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
4 pF
Power Dissipation (PD)
1.8 W
Power Dissipation (PD)
500 mW
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient (ΘJA)
350 °C/W
Thermal Resistance Junction-Case (ΘJC)
97.2 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N6430 Box@2,000 Active 200V,500mA,500mW Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage EAR99 8541.21.0075 LEAD or TIN

Resources

2N6430-6433.PDF Device Datasheet
Analytical Test Report:Bond Wire Analytical Test Report
Analytical Test Report:Cap Analytical Test Report
Analytical Test Report:Header Analytical Test Report
Analytical Test Report:Header Assembly Analytical Test Report
Analytical Test Report:Pure Tin Solder Analytical Test Report
Material Composition:TO-18 Material Composition
Package Detail Document:TO-18 Package Detail Document
Product Reliability Data:TO-18 Package Reliability Product Reliability Data

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