2N6545
400V,8A,71.5W Through-Hole Transistor-Bipolar Power (>1A) NPN High Voltage
Case Type: TO-3
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 5 A
IB = 1 A
Test Conditions
IC = 5 A
IB = 1 A
TC = 100 °C
Test Conditions
IC = 100 mA
Test Conditions
VCE = 850 V
VBE(OFF) = 1.5 V
Test Conditions
VCE = 850 V
VBE(OFF) = 1.5 V
TC = 100 °C
Test Conditions
VCE = 850 V
RBE = 50 Ω
TC = 100 °C
Test Conditions
IC = 5 A
IB = 1 A
Test Conditions
IC = 5 A
IB = 1 A
TC = 100 °C
Test Conditions
IC = 8 A
IB = 2 A
Test Conditions
VCL = 450 V
IC = 4.5 A
TC = 100 °C
Test Conditions
VCL = 300 V
IC = 8 A
TC = 100 °C
Test Conditions
VCE = 10 V
IC = 300 mA
f = 1 MHz
Test Conditions
VCE = 3 V
IC = 2.5 A
Test Conditions
VCE = 3 V
IC = 5 A
Test Conditions
VCC = 250 V
IC = 5 A
IB1 = 1 A
tp = 100 µs
Duty Cycle = 2 %
IB2 = 1 A
Test Conditions
VEB = 9 V
Test Conditions
VCC = 250 V
IC = 5 A
IB1 = 1 A
IB2 = 1 A
tp = 100 µs
Duty Cycle = 2 %
Test Conditions
VBE = 5 V
VCL = 450 V
IC = 5 A
IB1 = 1 A
TC = 100 °C
Test Conditions
VBE = 5 V
VCL = 450 V
IC = 5 A
IB1 = 1 A
TC = 25 °C
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCC = 250 V
IC = 5 A
IB1 = 1 A
tp = 100 µs
Duty Cycle = 2 %
IB2 = 1 A
Test Conditions
VCE = 100 V
tp = 1 s
Test Conditions
VCC = 250 V
IC = 5 A
IB1 = 1 A
IB2 = 1 A
tp = 100 µs
Duty Cycle = 2 %
Test Conditions
VBE = 5 V
VCL = 450 V
IC = 5 A
IB1 = 1 A
TC = 100 °C
Test Conditions
VBE = 5 V
VCL = 450 V
IC = 5 A
IB1 = 1 A
TC = 25 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N6545 | Sleeve@20 | Discontinued | 400V,8A,71.5W Through-Hole Transistor-Bipolar Power (>1A) NPN High Voltage | EAR99 | 8541.29.0095 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N6544.PDF | Device Datasheet |
| Analytical Test Report:Cap and Assembly | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Leads | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Material Composition:TO-3 | Material Composition |
| Package Detail Document:TO-3 | Package Detail Document |
| Process Change Notice:2N6545 | Process Change Notice |
| Product EOL Notice:Power transistors bare die and | Product EOL Notice |
| Product Reliability Data:TO-3 Package Reliability | Product Reliability Data |
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