2N930B
45V,30mA,500mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Case Type: TO-18
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 500 µA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 45 V
Test Conditions
IC = 10 mA
Test Conditions
VCE = 45 V
Test Conditions
VCE = 45 V
TA = 170 °C
Test Conditions
VCE = 5 V
Test Conditions
IC = 10 mA
IB = 500 µA
Test Conditions
VCE = 5 V
IC = 500 µA
f = 30 MHz
Test Conditions
VCE = 5 V
IC = 10 µA
Test Conditions
VCE = 5 V
IC = 10 µA
TA = -55 °C
Test Conditions
VCE = 5 V
IC = 10 mA
Test Conditions
VCE = 5 V
IC = 1 µA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 5 V
Test Conditions
VCE = 5 V
IC = 10 µA
f = 1 kHz
RS = 10 kΩ
Test Conditions
VCB = 5 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N930B | Box@2,000 | Discontinued | 45V,30mA,500mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0095 | LEAD or TIN |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| LSSGP054.PDF | Device Datasheet |
| Material Composition:TO-18 | Material Composition |
| Package Detail Document:TO-18 | Package Detail Document |
| Product EOL Notice:CMPT930 | Product EOL Notice |
| Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |