BC107A
45V,200mA,600mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Case Type: TO-18
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 2 mA
VCE = 5 V
Test Conditions
IC = 10 mA
VCE = 5 V
Test Conditions
IC = 10 mA
IB = 0.5 mA
(700 mV Typical)
Test Conditions
IC = 100 mA
IB = 5 mA
(1 V Typical)
Test Conditions
VCB = 45 V
Test Conditions
VCB = 45 V
TA = 125 °C
Test Conditions
IC = 2 mA
Test Conditions
IC = 10 mA
IB = 0.5 mA
Test Conditions
IC = 100 mA
IB = 5 mA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
Test Conditions
IE = 10 µA
Test Conditions
VCE = 5 V
IC = 200 µA
RS = 2 kΩ
BW = 200 Hz
f = 1 kHz
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
f = 1 kHz
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
BC107A | Box@2,000 | Discontinued | 45V,200mA,600mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN |
Resources
Item | Type |
---|---|
No matching documents found. | |
Analytical Test Report:Bond Wire | Analytical Test Report |
Analytical Test Report:Cap | Analytical Test Report |
Analytical Test Report:Header | Analytical Test Report |
Analytical Test Report:Header Assembly | Analytical Test Report |
Analytical Test Report:Pure Tin Solder | Analytical Test Report |
BC107.PDF | Device Datasheet |
Material Composition:TO-18 | Material Composition |
Package Detail Document:TO-18 | Package Detail Document |
Product EOL Notice:CMPT930 | Product EOL Notice |
Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |
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