BC178B
25V,100mA,300mW Through-Hole Transistor-Small Signal (<=1A) PNP Low Noise
Case Type: TO-18
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 2 mA
VCE = 5 V
Test Conditions
IC = 10 µA
Test Conditions
VCB = 20 V
Test Conditions
VCB = 20 V
TA = 150 °C
Test Conditions
IC = 5 mA
Test Conditions
IC = 10 µA
VBE(OFF) = 1 V
Test Conditions
IC = 10 mA
IB = 0.5 mA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 35 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
Test Conditions
IE = 10 µA
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| BC178B | Box@2,000 | Active | 25V,100mA,300mW Through-Hole Transistor-Small Signal (<=1A) PNP Low Noise | EAR99 | 8541.21.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| BC178B.PDF | Device Datasheet |
| Material Composition:TO-18 | Material Composition |
| Package Detail Document:TO-18 | Package Detail Document |
| Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |