BC184B
30V,200mA,300mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 µA
VCE = 5 V
Test Conditions
IC = 100 µA
VCE = 5 V
Test Conditions
IC = 2 mA
VCE = 5 V
Test Conditions
IC = 10 mA
VCE = 5 V
Test Conditions
IC = 100 mA
IB = 5 mA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 30 V
Test Conditions
IC = 2 mA
Test Conditions
IC = 10 mA
IB = 0.5 mA
Test Conditions
IC = 100 mA
IB = 5 mA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 5 V
IC = 10 µA
Test Conditions
VCE = 5 V
IC = 2 mA
Test Conditions
VCE = 5 V
IC = 100 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 4 V
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCE = 5 V
IC = 200 µA
f = 10 kHz
RG = 2 kΩ
Test Conditions
VCB = 10 V
f = 1 MHz
(3 pF Typical)
Test Conditions
VCE = 5 V
IC = 2 mA
f = 1 kHz
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
BC184B | Box@2,500 | Active | 30V,200mA,300mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN | |
BC184B APM | Ammo@2,000 | Active | 30V,200mA,300mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN | |
BC184B TRE | Tape & Reel@2,000 | Active | 30V,200mA,300mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN |
Resources
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No matching documents found. | |
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BC184B.PDF | Device Datasheet |
Material Composition:TO-92 | Material Composition |
Package Detail Document:TO-92 | Package Detail Document |
Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
Product Support
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Design Support
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- Special wafer diffusions
- Custom electrical curves
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development