BC559C
30V,100mA,500mW Through-Hole Transistor-Small Signal (<=1A) PNP Low Noise
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 2 mA
VCE = 5 V
Test Conditions
IC = 100 µA
Test Conditions
VCB = 20 V
Test Conditions
VCB = 20 V
TA = 150 °C
Test Conditions
IC = 10 mA
Test Conditions
IC = 100 µA
VBE(OFF) = 1 V
Test Conditions
IC = 10 mA
IB = 0.5 mA
Test Conditions
IC = 100 mA
IB = 5 mA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 35 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 6 V
Test Conditions
VCE = 5 V
IC = 0.2 mA
BW = 200 Hz
f = 1 kHz
RG = 2 kΩ
(1 dB Typical)
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| BC559C | Box@2,000 | Discontinued, Stock Only | 30V,100mA,500mW Through-Hole Transistor-Small Signal (<=1A) PNP Low Noise | EAR99 | 8541.21.0075 | PBFREE |
Resources
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|---|---|
| No matching documents found. | |
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| Analytical Test Report:Tin Plating | Analytical Test Report |
| BC559C.PDF | Device Datasheet |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
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