BF459
300V,100mA,1.2W Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage
Case Type: TO-126
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 µA
Test Conditions
VCB = 250 V
Test Conditions
IC = 10 mA
Test Conditions
IC = 30 mA
IB = 6 mA
Test Conditions
VCE = 10 V
IC = 15 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 30 mA
Test Conditions
IE = 1 mA
Test Conditions
VEB = 3 V
Test Conditions
VCB = 30 V
f = 1 MHz
Test Conditions
VCE = 30 V
IC = 1 mA
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| BF459 | Sleeve@50 | Discontinued | 300V,100mA,1.2W Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage | EAR99 | 8541.29.0075 | PBFREE | |
| BF459 SL | Sleeve@50 | Discontinued | 300V,100mA,1.2W Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage | EAR99 | 8541.29.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| BF457_SERIES.PDF | Device Datasheet |
| Material Composition:TO-126 | Material Composition |
| Package Detail Document:TO-126 | Package Detail Document |
| Product EOL Notice:Power transistors bare die and | Product EOL Notice |
| Product Reliability Data:TO-126 Package Reliability | Product Reliability Data |