CJD13003

400V,1.5A,15W Surface mount Transistor-Bipolar Power (>1A) NPN High Voltage

Case Type: DPAK

Base-Emitter Saturation Voltage (VBE(SAT))
1 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.2 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.1 V
Collector-Emitter Breakdown Voltage (BVCEO)
400 V
Collector-Emitter Cutoff Current (ICEV)
100 µA
Collector-Emitter Cutoff Current (ICEV)
2 mA
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1 V
Collector-Emitter Saturation Voltage (VCE(SAT))
3 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1 V
Collector-Emitter Voltage (VCEV)
700 V
Collector-Emitter Voltage (VCEO)
400 V
Continuous Base Current (IB)
750 mA
Continuous Collector Current (IC)
1.5 A
Continuous Emitter Current (IE)
2.25 A
Current Gain-Bandwidth Product (fT)
4 MHz
DC Current Gain (hFE)
8 — 40
DC Current Gain (hFE)
5 — 25
Delay Time (td)
0.1 µs
Emitter-Base Cutoff Current (IEBO)
1 mA
Emitter-Base Voltage (VEBO)
9 V
Fall Time (tf)
0.7 µs
Junction Temperature (Tj)
-65 — 150 °C
Output Capacitance (Cob)
20 pF
Peak Base Current (IBM)
1.5 A
Peak Collector Current (ICM)
3 A
Peak Emitter Current (IEM)
4.5 A
Power Dissipation (PD)
15 W
Power Dissipation (PD)
1.56 W
Rise Time (tr)
1 µs
Storage Temperature (Tstg)
-65 — 150 °C
Storage Time (ts)
4 µs
Thermal Resistance Junction-Ambient (ΘJA)
80.1 °C/W
Thermal Resistance Junction-Case (ΘJC)
8.33 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CJD13003 BK Box@150 Discontinued 400V,1.5A,15W Surface mount Transistor-Bipolar Power (>1A) NPN High Voltage EAR99 8541.29.0095 PBFREE
CJD13003 TR13 Tape & Reel@2,500 Discontinued 400V,1.5A,15W Surface mount Transistor-Bipolar Power (>1A) NPN High Voltage EAR99 8541.29.0095 PBFREE

Resources

Analytical Test Report:Die Attach Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Leadframe Analytical Test Report
Analytical Test Report:Ni added Al Bond Wire Analytical Test Report
Analytical Test Report:Sn Plating Analytical Test Report
Analytical Test Report:Sn Plating Analytical Test Report
CJD13003.PDF Device Datasheet
Material Composition:DPAK Material Composition
Package Detail Document:DPAK Package Detail Document
Product EOL Notice:DPAK TRANSISTORS Product EOL Notice
Product Reliability Data:DPAK Package Reliability Product Reliability Data

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AEM stands ready to assist with your latest design endeavors as your trusted partner.

  • Free quick ship samples (2nd day air)
  • Online technical data and parametric search
  • SPICE models
  • Custom electrical curves
  • Environmental regulation compliance
  • Customer specific screening
  • Up-screening capabilities
  • Special wafer diffusions
  • PbSn plating options
  • Package details
  • Application notes
  • Application and design sample kits
  • Custom product and package development