CM4209
15V,200mA,500mW Through-Hole Transistor-Small Signal (<=1A) PNP Saturated Switch
Case Type: TO-18
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 1 mA
IB = 100 µA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
IC = 100 µA
Test Conditions
IC = 100 µA
Test Conditions
IC = 3 mA
Test Conditions
VCE = 8 V
Test Conditions
VCE = 8 V
TA = 125 °C
Test Conditions
IC = 1 mA
IB = 100 µA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
VCE = 10 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 500 mV
IC = 1 mA
Test Conditions
VCE = 300 mV
IC = 10 mA
Test Conditions
VCE = 300 mV
IC = 10 mA
TA = -55 °C
Test Conditions
VCE = 1 V
IC = 50 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCC = 1.5 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VCC = 1.5 V
IC = 10 mA
IB1 = 1 mA
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
CM4209 | Box@2,000 | Discontinued | 15V,200mA,500mW Through-Hole Transistor-Small Signal (<=1A) PNP Saturated Switch | EAR99 | 8541.21.0075 | PBFREE |
Resources
Item | Type |
---|---|
No matching documents found. | |
Analytical Test Report:Bond Wire | Analytical Test Report |
Analytical Test Report:Cap | Analytical Test Report |
Analytical Test Report:Header | Analytical Test Report |
Analytical Test Report:Header Assembly | Analytical Test Report |
Analytical Test Report:Pure Tin Solder | Analytical Test Report |
CM4209.PDF | Device Datasheet |
Material Composition:TO-18 | Material Composition |
Package Detail Document:TO-18 | Package Detail Document |
Process Change Notice:PNP TO-18 Saturated Switching | Process Change Notice |
Product EOL Notice:CP742X PROCESS | Product EOL Notice |
Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |
Spice Model:Spice Model CM4209 | Spice Model |
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