CM5583
30V,500mA,1W Through-Hole Transistor-Small Signal (<=1A) PNP RF Oscillator
Case Type: TO-39
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 mA
VCE = 2 V
Test Conditions
IC = 10 µA
Test Conditions
VCB = 20 V
Test Conditions
VCB = 10 V
f = 63.6 MHz
IC = 50 mA
Test Conditions
IC = 10 mA
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
VCE = 10 V
IC = 40 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 100 mA
f = 100 MHz
Test Conditions
VCE = 2 V
IC = 40 mA
Test Conditions
VCE = 2 V
IC = 100 mA
Test Conditions
VCE = 5 V
IC = 300 mA
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 2 V
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VEB = 500 mV
f = 100 kHz
Test Conditions
VCB = 15 V
f = 100 kHz
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CM5583 | Box@500 | Discontinued | 30V,500mA,1W Through-Hole Transistor-Small Signal (<=1A) PNP RF Oscillator | EAR99 | 8541.29.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| CM5583.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Product EOL Notice:RF TRANSISTOR DIE | Product EOL Notice |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |
| Spice Model:Spice Model CM5583 | Spice Model |
Product Support
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Design Support
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- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development