CM5943
30V,400mA,1W Through-Hole Transistor-Small Signal (<=1A) NPN RF Oscillator
Case Type: TO-39
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
f = 200 MHz
IC = 10 mA
VCE = 15 V
Test Conditions
f = 250 MHz
IC = 50 mA
VCE = 15 V
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 15 V
Test Conditions
VCB = 15 V
f = 31.8 MHz
IE = 50 mA
Test Conditions
IC = 5 mA
Test Conditions
VCE = 20 V
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
VCE = 15 V
IC = 25 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 50 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 100 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 50 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 500 mV
f = 100 kHz
Test Conditions
VCE = 15 V
IC = 30 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 35 mA
f = 200 MHz
Test Conditions
VCB = 30 V
f = 100 kHz
Test Conditions
VCE = 15 V
IC = 50 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CM5943 | Box@500 | Discontinued | 30V,400mA,1W Through-Hole Transistor-Small Signal (<=1A) NPN RF Oscillator | EAR99 | 8541.29.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| CM5943.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Product EOL Notice:RF TRANSISTOR DIE | Product EOL Notice |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |
| Spice Model:Spice Model CM5943 | Spice Model |
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Design Support
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