CMLT3946E
Surface mount Transistor-Small Signal (<=1A) 40V,200mA Dual NPN&40V,200mA PNP General Purpose Amplifier
Case Type: SOT-563
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 1 mA
(750 mV Typical)
Test Conditions
IC = 50 mA
IB = 5 mA
(850 mV Typical)
Test Conditions
IC = 10 mA
IB = 1 mA
(750 mV Typical)
Test Conditions
IC = 50 mA
IB = 5 mA
(850 mV Typical)
Test Conditions
IC = 10 µA
(115 V Typical)
Test Conditions
IC = 10 µA
(90 V Typical)
Test Conditions
IC = 1 mA
(60 V Typical)
Test Conditions
IC = 1 mA
(55 V Typical)
Test Conditions
VCE = 30 V
VBE(OFF) = 3 V
Test Conditions
VCE = 30 V
VBE(OFF) = 3 V
Test Conditions
IC = 10 mA
IB = 1 mA
(57 mV Typical)
Test Conditions
IC = 50 mA
IB = 5 mA
(100 mV Typical)
Test Conditions
IC = 10 mA
IB = 1 mA
(50 mV Typical)
Test Conditions
IC = 50 mA
IB = 5 mA
(100 mV Typical)
Test Conditions
VCE = 20 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 20 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 0.1 mA
(240 Typical)
Test Conditions
VCE = 1 V
IC = 1 mA
(235 Typical)
Test Conditions
VCE = 1 V
IC = 10 mA
(215 Typical)
Test Conditions
VCE = 1 V
IC = 50 mA
(110 Typical)
Test Conditions
VCE = 1 V
IC = 100 mA
(50 Typical)
Test Conditions
VCE = 1 V
IC = 0.1 mA
(130 Typical)
Test Conditions
VCE = 1 V
IC = 1 mA
(150 Typical)
Test Conditions
VCE = 1 V
IC = 10 mA
(150 Typical)
Test Conditions
VCE = 1 V
IC = 50 mA
(120 Typical)
Test Conditions
VCE = 1 V
IC = 100 mA
(55 Typical)
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
IE = 10 µA
(7.5 V Typical)
Test Conditions
IE = 10 µA
(7.9 V Typical)
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 5 V
IC = 100 µA
RS = 1 kΩ
f = 15.7 kHz
Test Conditions
VCE = 5 V
IC = 100 µA
RS = 1 kΩ
f = 15.7 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CMLT3946E BK | Box@5,000 | Active | Surface mount Transistor-Small Signal (<=1A) 40V,200mA Dual NPN&40V,200mA PNP General Purpose Amplifier | EAR99 | 8541.21.0075 | PBFREE | |
| CMLT3946E TR | Tape & Reel@3,000 | Active | Surface mount Transistor-Small Signal (<=1A) 40V,200mA Dual NPN&40V,200mA PNP General Purpose Amplifier | EAR99 | 8541.21.0075 | PBFREE | |
| CMLT3946EG BK | Box@5,000 | Active | Surface mount Transistor-Small Signal (<=1A) 40V,200mA Dual NPN&40V,200mA PNP General Purpose Amplifier | EAR99 | 8541.21.0075 | PBFREE | |
| CMLT3946EG TR | Tape & Reel@3,000 | Active | Surface mount Transistor-Small Signal (<=1A) 40V,200mA Dual NPN&40V,200mA PNP General Purpose Amplifier | EAR99 | 8541.21.0075 | TIN |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Copper Bond Wire | Analytical Test Report |
| Analytical Test Report:Gold Bond Wire | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Halogen Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| CMLT3904E_06E_46E.PDF | Device Datasheet |
| Material Composition:SOT-563 | Material Composition |
| Package Detail Document:SOT-563 | Package Detail Document |
| Process Change Notice:Copper Wire Bonding - SOT-563 | Process Change Notice |
| Process Change Notice:SMD Transistor Halogen Free | Process Change Notice |
| Process Change Notice:SOT-563 Alternate Lead Frame | Process Change Notice |
| Product Reliability Data:SOT-563 Package Reliability | Product Reliability Data |
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Design Support
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- Online technical data and parametric search
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- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development