CMLT4413
Surface mount Transistor-Small Signal (<=1A) 40V,600mA Dual NPN&40V,600mA PNP General Purpose Amplifier
Case Type: SOT-563
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VCE = 35 V
VBE(OFF) = 400 mV
Test Conditions
VCE = 35 V
VBE(OFF) = 400 mV
Test Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 100 µA
Test Conditions
IC = 100 µA
Test Conditions
IC = 1 mA
Test Conditions
IC = 1 mA
Test Conditions
VCE = 35 V
VBE(OFF) = 400 mV
Test Conditions
VCE = 35 V
VBE(OFF) = 400 mV
Test Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCE = 10 V
IC = 20 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 20 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 100 µA
Test Conditions
VCE = 1 V
IC = 1 mA
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 1 V
IC = 150 mA
Test Conditions
VCE = 2 V
IC = 500 mA
Test Conditions
VCE = 1 V
IC = 100 µA
Test Conditions
VCE = 1 V
IC = 1 mA
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 2 V
IC = 150 mA
Test Conditions
VCE = 2 V
IC = 500 mA
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
VBE = 2 V
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
VBE = 2 V
Test Conditions
IE = 100 µA
Test Conditions
IE = 100 µA
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
VBE = 2 V
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
VBE = 2 V
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CMLT4413 TR | Tape & Reel@3,000 | Active | Surface mount Transistor-Small Signal (<=1A) 40V,600mA Dual NPN&40V,600mA PNP General Purpose Amplifier | EAR99 | 8541.21.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Copper Bond Wire | Analytical Test Report |
| Analytical Test Report:Gold Bond Wire | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Halogen Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| CMLT4413.PDF | Device Datasheet |
| Material Composition:SOT-563 | Material Composition |
| Package Detail Document:SOT-563 | Package Detail Document |
| Process Change Notice:Copper Wire Bonding - SOT-563 | Process Change Notice |
| Process Change Notice:SOT-563 Alternate Lead Frame | Process Change Notice |
| Product Reliability Data:SOT-563 Package Reliability | Product Reliability Data |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development