GES6014
60V,800mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN High Current
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
VCE = 5 V
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 25 V
Test Conditions
IC = 100 µA
Test Conditions
IC = 10 mA
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCE = 10 V
IC = 10 mA
f = 30 MHz
Test Conditions
VCE = 1 V
IC = 100 µA
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 1 V
IC = 100 mA
Test Conditions
VCE = 2 V
IC = 500 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 3 V
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 5 V
IC = 100 µA
BW = 15.7 kHz
f = 10 kHz
RS = 5 kΩ
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| GES6014 | Box@2,500 | Active | 60V,800mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN High Current | EAR99 | 8541.21.0075 | LEAD or TIN |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
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| Analytical Test Report:Halogen Free | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| GES6014-16.PDF | Device Datasheet |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
Product Support
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Design Support
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- Application and design sample kits
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