MJE3440
250V,300mA,15W Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage
Case Type: TO-126
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 50 mA
VCE = 10 V
Test Conditions
IC = 50 mA
IB = 4 mA
Test Conditions
VCB = 250 V
Test Conditions
IC = 5 mA
Test Conditions
VCE = 300 V
VBE(OFF) = 1.5 V
Test Conditions
VCE = 200 V
Test Conditions
IC = 50 mA
IB = 4 mA
Test Conditions
VCE = 10 V
IC = 10 mA
f = 5 MHz
Test Conditions
VCE = 10 V
IC = 2 mA
Test Conditions
VCE = 10 V
IC = 20 mA
Test Conditions
VEB = 5 V
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 5 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| MJE3440 | Sleeve@50 | Discontinued | 250V,300mA,15W Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage | EAR99 | 8541.29.0095 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| LSSGP088.PDF | Device Datasheet |
| Material Composition:TO-126 | Material Composition |
| Package Detail Document:TO-126 | Package Detail Document |
| Product EOL Notice:Power transistors bare die and | Product EOL Notice |
| Product Reliability Data:TO-126 Package Reliability | Product Reliability Data |
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Design Support
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