MPQ2369
15V,500mA,500mW Through-Hole Transistor-Quad NPN General Purpose Amplifier/Switch
Case Type: TO-116
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 20 V
Test Conditions
IC = 10 mA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
VCE = 10 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 2 V
IC = 100 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 3 V
Test Conditions
VEB = 0.5 V
f = 140 kHz
Test Conditions
VCB = 5 V
f = 140 kHz
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 3 mA
IB2 = 1.5 mA
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 3 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| MPQ2369 | Sleeve@25 | Discontinued | 15V,500mA,500mW Through-Hole Transistor-Quad NPN General Purpose Amplifier/Switch | EAR99 | 8541.21.0075 | TIN |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Halogen Free | Analytical Test Report |
| Analytical Test Report:Lead frame | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
| Material Composition:TO-116 | Material Composition |
| MPQ2369.PDF | Device Datasheet |
| Package Detail Document:TO-116 | Package Detail Document |
| Process Change Notice:CP207 replaced by CP396V | Process Change Notice |
| Product EOL Notice:TO-116 CASE | Product EOL Notice |
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Design Support
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