PN3565
25V,50mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 µA
Test Conditions
VCB = 25 V
Test Conditions
VCB = 25 V
TA = 65 °C
Test Conditions
IC = 2 mA
Test Conditions
IC = 1 mA
IB = 100 µA
Test Conditions
VCE = 5 V
IC = 1 mA
f = 20 MHz
Test Conditions
VCE = 10 V
IC = 100 µA
Test Conditions
VCE = 10 V
IC = 1 mA
Test Conditions
IE = 10 µA
Test Conditions
VCE = 5 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 5 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 5 V
f = 140 kHz
Test Conditions
VCE = 5 V
IC = 1 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| PN3565 | Box@2,500 | Discontinued | 25V,50mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN | |
| PN3565-18 | Box@2,000 | Discontinued | 25V,50mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | PBFREE |
Resources
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| No matching documents found. | |
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| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| PN3565.PDF | Device Datasheet |
| Product EOL Notice:CMPT930 | Product EOL Notice |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |