CTLM3474-M832D
Surface mount Transistor-Small Signal (<=1A) 25V,1A Dual NPN&25V,1A PNP Low VCE(SAT)
Case Type: TLM832D
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
VCE = 1 V
Test Conditions
IC = 10 mA
VCE = 1 V
Test Conditions
IC = 800 mA
IB = 80 mA
Test Conditions
IC = 800 mA
IB = 80 mA
Test Conditions
IC = 100 µA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 40 V
Test Conditions
VCB = 40 V
Test Conditions
IC = 10 mA
Test Conditions
IC = 10 mA
Test Conditions
IC = 50 mA
IB = 5 mA
(25 mV Typical)
Test Conditions
IC = 100 mA
IB = 10 mA
(40 mV Typical)
Test Conditions
IC = 200 mA
IB = 20 mA
(80 mV Typical)
Test Conditions
IC = 500 mA
IB = 50 mA
(190 mV Typical)
Test Conditions
IC = 800 mA
IB = 80 mA
(290 mV Typical)
Test Conditions
IC = 1 A
IB = 100 mA
(360 mV Typical)
Test Conditions
IC = 50 mA
IB = 5 mA
(30 mV Typical)
Test Conditions
IC = 100 mA
IB = 10 mA
(50 mV Typical)
Test Conditions
IC = 200 mA
IB = 20 mA
(95 mV Typical)
Test Conditions
IC = 500 mA
IB = 50 mA
(205 mV Typical)
Test Conditions
IC = 800 mA
IB = 80 mA
(320 mV Typical)
Test Conditions
IC = 1 A
IB = 100 mA
(400 mV Typical)
Test Conditions
VCE = 10 V
IC = 50 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 50 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 1 V
IC = 100 mA
Test Conditions
VCE = 1 V
IC = 500 mA
Test Conditions
VCE = 1 V
IC = 1 A
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 1 V
IC = 100 mA
Test Conditions
VCE = 1 V
IC = 500 mA
Test Conditions
VCE = 1 V
IC = 1 A
Test Conditions
IE = 100 µA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 6 V
Test Conditions
VEB = 6 V
Test Conditions
VCB = 10 V
f = 1 MHz
(6 pF Typical)
Test Conditions
VCB = 10 V
f = 1 MHz
(10 pF Typical)
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CTLM3474-M832D TR | Tape & Reel@3,000 | Discontinued | Surface mount Transistor-Small Signal (<=1A) 25V,1A Dual NPN&25V,1A PNP Low VCE(SAT) | EAR99 | 8541.29.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Gold Bond Wire | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| CTLM3410-M832D.PDF | Device Datasheet |
| Package Detail Document:TLM832D | Package Detail Document |
| Process Change Notice:TLM832D Leadframe change from | Process Change Notice |
| Product EOL Notice:BLANKET PDN-ALL OTHER PRODUCTS | Product EOL Notice |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development