CP230-HTIP122-CM
5A,100V Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,80.000 X 80.000 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 3 A
VCE = 3 V
Test Conditions
VCB = 100 V
Test Conditions
IC = 100 mA
Test Conditions
VCE = 50 V
Test Conditions
IC = 3 A
IB = 12 mA
Test Conditions
IC = 5 A
IB = 20 mA
Test Conditions
VCE = 4 V
IC = 3 A
f = 1 MHz
Test Conditions
VCE = 3 V
IC = 500 mA
Test Conditions
VCE = 3 V
IC = 3 A
Test Conditions
VEB = 5 V
Test Conditions
VCB = 10 V
f = 100 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP230-HTIP122-CM | WafflePack@100 | Discontinued | 5A,100V Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,80.000 X 80.000 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP230-TIP122_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CP230 / CP630 | Product EOL Notice |