CP310-MPSA42

300V,500mA,625mW Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,25.980 X 25.980 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Base-Emitter Saturation Voltage (VBE(SAT))
900 mV
Collector-Base Breakdown Voltage (BVCBO)
300 V
Collector-Base Cutoff Current (ICBO)
100 nA
Collector-Base Voltage (VCBO)
300 V
Collector-Emitter Breakdown Voltage (BVCEO)
300 V
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Voltage (VCEO)
300 V
Continuous Collector Current (IC)
500 mA
Current Gain-Bandwidth Product (fT)
50 MHz
DC Current Gain (hFE)
25
DC Current Gain (hFE)
40
DC Current Gain (hFE)
40
Emitter-Base Breakdown Voltage (BVEBO)
6 V
Emitter-Base Cutoff Current (IEBO)
100 nA
Emitter-Base Voltage (VEBO)
6 V
Junction Temperature (Tj)
-65 — 150 °C
Output Capacitance (Cob)
3 pF
Power Dissipation (PD)
625 mW
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
200 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP310-HMPSA42-CM WafflePack@400 Active 300V,500mA,625mW Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,25.980 X 25.980 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP310-MPSA42-CM WafflePack@400 Active 300V,500mA,625mW Bare die,25.980 X 25.980 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP310-MPSA42-CT WafflePack@400 Active 300V,500mA,625mW Bare die,25.980 X 25.980 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP310-MPSA42-CT20 WafflePack@20 Special Order Item 300V,500mA,625mW Bare die,25.980 X 25.980 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP310-MPSA42-WN Wafer Active 300V,500mA,625mW Bare die,25.980 X 25.980 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE

Resources

Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP310-MPSA42_WPD.pdf Device Datasheet
Package Detail Document:WAFER Package Detail Document
Process Change Notice:WAFER THICKNESS REDUCTION Process Change Notice
Spice Model:Spice Model CP310 Spice Model

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