2N3819

8V,10mA,360mW Through-Hole JFET N Channel

Case Type: TO-92

Common Source Input Capacitance (Ciss)
8 pF
Common Source Reverse Transfer Capacitance (Crss)
4 pF
Continuous Gate Current (IG)
10 mA
Drain-Gate Voltage (VDG)
25 V
Drain-Source Voltage (VDS)
25 V
Forward Transadmittance (gfs)
2 — 6.5 mS
Forward Transadmittance (gfs)
1.6 mS
Gate Leakage Current (IGSS)
2 nA
Gate Leakage Current (IGSS)
2 µA
Gate-Source Breakdown Voltage (BVGSS)
25 V
Gate-Source Cutoff Voltage (VGS(OFF))
8 V
Gate-Source Cutoff Voltage (VGS(OFF))
0.5 — 7.5 V
Gate-Source Voltage (VGS)
25 V
Junction Temperature (Tj)
-65 — 150 °C
Output Conductance (gos)
50 µS
Power Dissipation (PD)
360 mW
Saturation Drain Current (IDSS)
2 — 20 mA
Storage Temperature (Tstg)
-65 — 150 °C

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N3819 Box@2,500 Active 8V,10mA,360mW Through-Hole JFET N Channel EAR99 8541.21.0095 LEAD or TIN
2N3819 APM Ammo@2,000 Active 8V,10mA,360mW Through-Hole JFET N Channel EAR99 8541.21.0095 LEAD or TIN
2N3819 TRE Tape & Reel@2,000 Active 8V,10mA,360mW Through-Hole JFET N Channel EAR99 8541.21.0095 LEAD or TIN
2N3819-5T Box@2,000 Active 8V,10mA,360mW Through-Hole JFET N Channel EAR99 8541.21.0095 PBFREE

Resources

2N3819.PDF Device Datasheet
Analytical Test Report:Copper Bonding Wire Analytical Test Report
Analytical Test Report:Copper Wire Analytical Test Report
Analytical Test Report:Epoxy Adhesive Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Free Analytical Test Report
Analytical Test Report:Pure Tin Solder, Sn Analytical Test Report
Analytical Test Report:Tin Plating Analytical Test Report
Material Composition:TO-92 Material Composition
Package Detail Document:TO-92 Package Detail Document
Process Change Notice:CP210->CP232V Process Change Notice
Product Brief:PB JFETs Product Brief
Product Reliability Data:TO-92 Package Reliability Product Reliability Data
Spice Model:2N3819 Spice Model

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