Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 20 V
f = 1 MHz
Test Conditions
VGS = 7 V
f = 1 MHz
Test Conditions
VDS = 20 V
VGS = 7 V
Test Conditions
VDS = 20 V
VGS = 7 V
TA = 150 °C
Test Conditions
f = 1 kHz
Test Conditions
ID = 6 mA
Test Conditions
VGS(off) = 7 V
Test Conditions
VGS = 20 V
Test Conditions
VGS = 20 V
TA = 125 °C
Test Conditions
IG = 1 µA
Test Conditions
VDS = 20 V
ID = 1 nA
Test Conditions
IG = 1 mA
Test Conditions
ID(on) = 6 mA
Test Conditions
VDS = 20 V
Test Conditions
ID = 1 mA
Test Conditions
VGS(off) = 7 V
Test Conditions
ID(on) = 6 mA
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
2N4392 | Box@2,000 | Active | 2V,5V,50mA,1.8W Through-Hole JFET N Channel | EAR99 | 8541.29.0095 | TIN |
Resources
Item | Type |
---|---|
No matching documents found. | |
2N4391-4393.PDF | Device Datasheet |
Analytical Test Report:Bond Wire | Analytical Test Report |
Analytical Test Report:Cap | Analytical Test Report |
Analytical Test Report:Header | Analytical Test Report |
Analytical Test Report:Header Assembly | Analytical Test Report |
Analytical Test Report:Pure Tin Solder | Analytical Test Report |
Material Composition:TO-18 | Material Composition |
Package Detail Document:TO-18 | Package Detail Document |
Process Change Notice:CP216 REPLACES CP206 | Process Change Notice |
Process Change Notice:CP226 REPLACE CP216 | Process Change Notice |
Product Brief:PB JFETs | Product Brief |
Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |
Spice Model:Spice Model 2N_4392 | Spice Model |
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