Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 20 V
f = 1 MHz
Test Conditions
VGS = 12 V
f = 1 MHz
Test Conditions
VDS = 20 V
VGS = 12 V
Test Conditions
VDS = 20 V
VGS = 12 V
TA = 100 °C
Test Conditions
f = 1 kHz
Test Conditions
ID = 12 mA
Test Conditions
VGS(off) = 12 V
Test Conditions
VGS = 20 V
Test Conditions
VGS = 20 V
TA = 100 °C
Test Conditions
IG = 1 µA
Test Conditions
VDS = 20 V
ID = 1 nA
Test Conditions
IG = 1 mA
Test Conditions
ID(on) = 12 mA
Test Conditions
VDS = 20 V
Test Conditions
ID = 1 mA
Test Conditions
VGS(off) = 12 V
Test Conditions
ID(on) = 12 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| PN4391 APM | Ammo@2,000 | Active | 4V,10V,50mA,625mW Through-Hole JFET N Channel | EAR99 | 8541.21.0095 | LEAD or TIN | |
| PN4391 TRE | Tape & Reel@2,000 | Active | 4V,10V,50mA,625mW Through-Hole JFET N Channel | EAR99 | 8541.21.0095 | LEAD or TIN |
Resources
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|---|---|
| No matching documents found. | |
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| Analytical Test Report:Tin Plating | Analytical Test Report |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| PN4391-4393.PDF | Device Datasheet |
| Process Change Notice:CP216 REPLACES CP206 | Process Change Notice |
| Process Change Notice:CP226 REPLACE CP216 | Process Change Notice |
| Process Change Notice:TO-92 process change eutectic | Process Change Notice |
| Product Brief:PB JFETs | Product Brief |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
| Spice Model:Spice Model PN4391 | Spice Model |
Product Support
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- Supply management (Customer portals)
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- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development